The Electron Beam Ion Trap at Berkeley Lab

Publications:

G.D. Fuchs, V.V. Dobrovitski, R. Hanson, A. Batra, C.D. Weis, T. Schenkel, D.D. Awschalom,
Excited-State Spectroscopy Using Single Spin Manipulation in Diamond,
Physical Review Letters 101:117601, 2008 pdf(650k) bibtex

M. Sarovar, K.C. Young, T. Schenkel, K.B. Whaley,
Quantum nondemolition measurements of single donor spins in semiconductors,
Physical Review B 78:245302, 2008 pdf(747k) bibtex

J.J.L. Morton, A.M. Tyryshkin, R.M. Brown, S. Shankar, B.W. Lovett, A. Ardavan, T. Schenkel, E.E. Haller, J.W. Ager, S.A. Lyon,
Solid-state quantum memory using the ³¹P nuclear spin,
nature 455(23):1085-1088, 2008 pdf(627k) bibtex

C.D. Weis, A. Schuh, A. Batra, A. Persaud, I.W. Rangelow, J. Bokor, C.C. Lo, S. Cabrini, E. Sideras-Haddad, G.D. Fuchs, R. Hanson, D.D. Awschalom, T. Schenkel,
Single atom doping for quantum device development in diamon and silicon,
Journal of Vacuum Science and Technology B 26(6):2596-2600, 2008 pdf(467k) bibtex

C.C. Lo, J. Bokor, T. Schenkel, A.M. Tyryshkin, S.A. Lyon,
Spin-Dependent Scattering off Neutral Antimony Donors in 28Si Field-Effect Transistors,
Applied Physics Letters 91:242106, 2007 bibtex

A. Batra, C.D. Weis, J. Reijonen, A. Persaud, S. Cabrini, C.C. Lo, J. Bokor, T. Schenkel,
Detection of low energy single ion impacts in micron scale transistors at room temperature ,
Applied Physics Letters 91:193502, 2007 pdf(299k) bibtex

S.J. Robinson, C.L. Perkins, T.C. Shen, J.R. Tucker, T. Schenkel, X.W. Wang, T.P. Ma,
Low-temperature charge transport in Ga-acceptor nanowires implanted by focused-ion beams,
Applied Physics Letters 91:122105, 2007 pdf(276k) bibtex

G. Chai, H. Heinrich, L. Chow, T. Schenkel,
Electron transport through single carbon nanotubes,
Applied Physics Letters 91:103101, 2007 pdf(233k) bibtex

D. Schneider, J. McDonald, B. Zielbauer, D. Ursescu, U. Spillmann, T. Stoelker, T. Kuehl, T. Schenkel, G. Andler, E. Lindroth, R. Schuch,
Nuclear Instruments and Methods in Physics Research B 261:239, 2007 pdf(146k) bibtex

W.J. MoberlyChan, D.P. Adams, M.J. Aziz, G. Hobler, T. Schenkel,
Fundamentals of Focused Ion Beam Nanostructural Processing: Below, At, and Above the Surface,
MRS Bulletin 32(5):424, 2007 pdf(2594k) bibtex

E. Sideras-Haddad, T. Schenkel, D.B. Rebuli, A. Persaud, S. Shrivastava, D.H. Schneider, B. Mwakikunga,
Electron emission and defect formation in the interaction of slow, highly charged ions with diamond surfaces,
Nuclear Instruments and Methods in Physics Research B 256:464, 2007 pdf(232k) bibtex

A.M. Tyryshkin, S.A. Lyon, T. Schenkel, J. Bokor, J. Chu, W. Jantasch, F. Schäffler, J.L. Truitt, S.N. Coppersmith, M.A. Eriksson,
Electron Spin Coherence in Silicon,
Physica E 35:257-263, 2006 pdf(210k) bibtex

A. Persaud, K. Ivanova, Y. Sarov, Tzv. Ivanov, B.E. Volland, I.W. Rangelow, N. Nikolov, T. Schenkel, V. Djakov, D.W.K. Jenkins, J. Meijer, T. Vogel,
Micromachined piezoresistive proximal probe with integrated bimorph actuator for aligned single ion implantation,
Journal of Vacuum Science and Technology B 24:3148, 2006 pdf(244k) bibtex

F.R. Bradbury, A.M. Tyryshkin, G. Sabouret, J. Bokor, T. Schenkel, S. A. Lyon,
Stark Tuning of Donor Electron Spins in Silicon,
Physical Review Letters 97:176404, 2006 pdf(298k) bibtex cond-mat/0603324

T. Schenkel, A.M. Tyryshkin, R. de Sousa, K.B. Whaley, J. Bokor, J.A. Liddle, A. Persaud, J. Shangkuan, I. Chakarov, S. A. Lyon,
Electrical activation and spin coherence of ultra low dose antimony implants in silicon,
Applied Physics Letters 88(11):112101, 2006 pdf(201k) bibtex cond-mat/0507318

T. Schenkel, J.A. Liddle, J. Bokor, A. Persaud, S.J. Park, J. Shangkuan, C.C. Lo, S. Kwon, S.A. Lyon, A.M. Tyryshkin, I.W. Rangelow, Y. Sarov, D.H. Schneider, J. Ager, R. de Sousa,
Strategies for integration of donor electron spin qubits,
Microelectronic Engineering 83(4-9):1814-1817, 2006 pdf(241k) bibtex

F.I. Allen, A. Persaud, S.J. Park, A. Minor, M. Sakurai, D.H. Schneider, T. Schenkel,
Transport of Multiply and Highly Charged Ions through Nanoscale Apertures in Silicon Nitride Membranes,
Nuclear Instruments and Methods in Physics Research B 244:323-326, 2006 pdf(222k) bibtex

F.I. Allen, A. Persaud, S.J. Park, A. Minor, M. Sakurai, D.H. Schneider, T. Schenkel,
Transport of mulitply and highly charged ions through nanoscale apertures in silicon nitride membranes,
Nuclear Instruments and Methods in Physics Research B 244(2):323-326, 2006 bibtex

T. Schenkel,
Semiconductor physics - Reliable performance,
Nature Materials 240:829-833, 2005 bibtex

A. Persaud, S.J. Park, J.A. Liddle, T. Schenkel, I.W. Rangelow,
Integration of scanning probes and ion beams,
2005 bibtex

T.-C. Shen, J.S. Kline, T. Schenkel, S.J. Robinson, J.-Y. Ji, C. Yang, R.-R. Du, J.R. Tucker,
Nanoscale electronics based on two-dimensional dopant patterns in sislicon,
Nano Letters 5(6):1087-1091, 2004 pdf(342k) bibtex

S.J. Park, J.A. Liddle, A. Persaud, F.I. Allen, T. Schenkel, J. Bokor,
Formation fo 15 nm scale Coloumb blockade structures in silicon by electron beam lithography with a bilayer resist process,
Journal of Vacuum Science and Technology B 22(6):3182-3185, 2004 pdf(294k) bibtex

A. Persaud, F. Allen, F. Gicquel, S.J. Park, J.A. Liddle, T. Schenkel, Tzv. Ivanov, K. Ivanova, I.W. Rangelow, J. Bokor,
Single ion implantation with scanning probe alignment,
Journal of Vacuum Science and Technology B 22(6):3115-3118, 2004 pdf(324k) bibtex

A. Persaud, S.J. Park, J.A. Liddle, I.W. Rangelow, J. Bokor, R. Keller, F.I. Allen, D.H. Schneider, T. Schenkel,
Quantum Computer Development with Single Ion Implantation,
Journal of Vacuum Science and Technology B 22(6):2992-2994, 2004 pdf(249k) bibtex

J.W. McDonald, A.V. Hamza, M.W. Newman, J.P. Holder, D.H. Schneider, T. Schenkel,
Surface charge compensation for a highly charged ion emission microscope,
Quantum Information Processing 3:233-245, 2004 pdf(2139k) bibtex

P. Grabiec, J. Radojewski, M. Zaborowski, K. Domanski, T. Schenkel, I.W. Rangelow,
Batch fabricated scanning near field optical microscope/atomic force microscopy microprobe integrated with piezoresistive cantilever beam with highly reproducible focused ion beam micromachined aperture,
Ultramicroscopy 101(2-4):225-229, 2004 pdf(587k) bibtex

S.J. Park, A. Persaud, J.A. Liddle, J. Nilsson, J. Bokor, D.H. Schneider, I.W. Rangelow, T. Schenkel,
Processing issues in top-down approaches to quantum computer development in silicon,
Journal of Vacuum Science and Technology B :16-21, 2004 pdf(406k) bibtex

T. Schenkel, I.W. Rangelow, R. Keller, S.J. Park, J. Nilsson, A. Persaud, V.R. Radmilovic, P. Grabiec, D.H. Schneider, J.A. Liddle, J. Bokor,
Open questions in electronic sputtering of solids by slow highly charged ions with respect to applications in single ion implantation,
Microelectronic Engineering 73-74:695-700, 2004 pdf(385k) bibtex

T. Schenkel, V. Radmilovic, E.A. Stach, S.J. Park, A. Persaud,
Formation of a few nanometer wide holes in membranes with a dual beam focused ion beam system,
Nuclear Instruments and Methods in Physics Research B 219-220:200-205, 2003 pdf(664k) ps.gz(985k) bibtex

T. Schenkel, K.J. Wu,
Probing nano-environments of peptide molecules on solid surfaces by highly charged ion secondary ion mass spectrometry,
Journal of Vacuum Science and Technology B 21(6):2720-2723, 2003 pdf(167k) bibtex

T. Schenkel, A. Persaud, S.J. Park, J. Nilsson, J. Bokor, J.A. Liddle, R. Keller, D.H. Schneider, D.W. Cheng, D.E. Humphries,
Solid state quantum computer development in silicon with single ion implantation,
International Journal of Mass Spectroscopy 229:47-53, 2003 bibtex

T. Schenkel, A. Persaud, S. J. Park, J. Meijer, J. R. Kinglsey, J. W. McDonald, J. P. Holder, J. Bokor, D. H. Schneider,
Single Ion Implantation for Solid State Quantum Computer Development,
Journal of Applied Physics 94(11):7017-7024, 2002 pdf(607k) bibtex

G.A. Machicoane, T. Schenkel, T.R. Niedermayr, M.W. Newmann, A.V. Hamza, A.V. Barnes, J.W. McDonald, J.A. Tanis, D.H. Schneider,
Internal dielectronic excitation in highly charged ions colliding with surfaces,
Journal of Vacuum Science and Technology B 20:2816-2823, 2002 pdf(102k) bibtex

T. Schenkel, A. V. Hamza, J. P. Holder, K. Krämer, J. W. McDonald, A. Persaud, D. H. Schneider,
Extraction of highly charged ions from the electron beam ion trap at LBNL for applications in surface analysis and materials science,
Physical Review A 65:042903, 2002 pdf(113k) bibtex

J. W. McDonald, R. W. Bauer, D. H. Schneider,
Extraction of highly charged ions (up to 90+) from a high-energy electron-beam ion trap,
Review of Scientific Instruments 73:663-666, 2002 pdf(89k) bibtex

T. Schenkel, J. P. Holder, J. W. McDonald, J. Meijer, A. Persaud, D. H. Schneider,
Single Ion Implantation for Solid State Quantum Computer Development,
Review of Scientific Instruments 73:30-35, 2002 pdf(384k) bibtex

A.V. Hamza, M.W. Newman, P.A. Thielen, H.W.H. Lee, T. Schenkel, J.W. McDonald, D.H. Schneider,
Light-emitting nanostructers formed by intense, ultrafast electronic excitation in silicon (100),
in SPIE V4656, 2001 pdf(39k) bibtex cond-mat/0201549

T. Schenkel, A.V. Hamza, M.W. Newman, G. Machicoane, J.W. McDonald, D.H. Schneider, K.J. Wu, V.Kh. Lichtenstein,
Transport of Hollow Atoms Through Thin Dielectric Films,
Applied Physics Letters 79:2973-2975, 2001 pdf(299k) bibtex

T. Schenkel, A. Krämer, K.-N. Leung, A.V. Hamza, J.W. McDonald, D.H. Schneider,
Highly Charged Ion - Secondary Ion Mass Spectrometry (HCI-SIMS): Towards Metrology Solutions for sub 100 nm Technology Nodes,
Physica Scripta T92:208-210, 2001 pdf(342k) bibtex

J.W. McDonald, T. Schenkel, M.W. Newman, G. Overturf, H. Gregg, T.R. Niedermayr, A.V. Barnes, D.H. Schneider, I. A. Mowat,
Effects of Radiation on 1,3,5-Triamino-2,4,6-Trinitrobenzene (TATB) Studied by Time-of-Flight Secondary Ion Mass Spectrometry,
in SPIE V4468, 2001 bibtex

B.L. Doyle, D.S. Walsh, S.N. Renfrow, G. Vizkelethy, T. Schenkel, A.V. Hamza,
Nuclear Emission Microscopies,
Journal of Energetic Materials V 19/2-3:101, 2001 pdf(576k) bibtex

A.V. Hamza, A.V. Barnes, E. Magee, M. Newman, T. Schenkel, J.W. McDonald, D.H. Schneider,
Highly charged ion based time-of-flight emission microscope,
Nuclear Instruments and Methods in Physik Research B 181:199, 2000 pdf(389k) bibtex

T. Schenkel, M.W. Newman, T.R. Niedermayr, G.A. Machicoane, J.W. McDonald, A.V. Barnes, A.V. Hamza, J.C. Banks, B.L. Doyle, K.J. Wu,
Electronic sputterin of solids by slow, highly charged ions: Fundamentals and applications,
Review of Scientific Instruments 71(5):2077-2081, 2000 pdf(204k) bibtex

T. Schlathölter, M.W. Newman, T.R. Niedermayr, G.A. Machicoane, J.W. McDonald, T. Schenkel, R. Hoekstra, A.V. Hamza,
Hydrogenated carbon clusters produced by highly charged ion impact on solid C₈₄,
Nuclear Instruments and Methods in Physik Research B 161-163:65-75, 2000 pdf(228k) bibtex

T. Schenkel, T. Schlathölter, M.W. Newman, G.A. Machicoane, J.W. McDonald, A.V. Hamza,
Influence of hydrogen on the stability of psitiely charged silicon dioxide clusters,
The European Physical Journal D 12:323-327, 2000 pdf(68k) bibtex

T. Schenkel, A.V. Hamza, A.V. Barnes, D.H. Schneider,
Interaction of slow, very highly charged ions with surfaces,
Journal of Chemical Physics 113(6):2419-2422, 1999 pdf(1396k) bibtex

A.V. Hamza, T. Schenkel, A.V. Barnes,
Dependence of cluster ion emission form uranium oxide surfaces on the charge state of the incident slow highly charged ion,
Progress in Surface Science 61:23-84, 1999 pdf(350k) bibtex

T. Schenkel, A.V. Hamza, A.V. Barnes, M.W. Newman, G. Machicoane, T. Niedermayer, M. Hattass, J.W. McDonald, D.H. Schneider, K.J. Wu, R.W. Odom,
Surface Analysis by Highly Charged Ion Based Secondary Ion Mass Spectrometry,
The European Physical Journal D 6:83-87, 1999 pdf(132k) bibtex

T. Schenkel, A.V. Barnes, T.R. Niedermayer, M. Hattass, M.W. Newman, G.A. Machicoane, J.W. McDonald, A.V. Hamza, D.H. Schneider,
Deposition of Potential Energy in Solids by Slow, Highly Charged Ions,
Physica Scripta T80:73-75, 1999 pdf(56k) bibtex

M. Hattass, T. Schenkel, A.V. Hamza, A.V. Barnes, M.W. Newman, J.W. McDonald, T.R. Niedermayer, G.A. Machicoane, D.H. Schneider,
Charge Equilibration Time of Slow, Highly Charged Ions in Solids,
Physical Review Letters 83:4273-4276, 1999 pdf(94k) bibtex

T. Schenkel, K.J. Wu, J. Li, N. Newman, A.V. Barnes, J.W. McDonald, A.V. Hamza,
Analysis of submicron Cu-Ta-SiO₂ structures by highly charged ion secondary ion mass spectrocscopy,
Physical Review Letters 82:4795-4798, 1999 pdf(140k) bibtex

A.V. Hamza, T. Schenkel, A.V. Barnes, D.H. Schneider,
Secondary ion coincidence in highly charged ion based secondary ion mass spectroscopy for process characterization,
Journal of Vacuum Science and Technology B 17:2331-2335, 1998 pdf(827k) bibtex

T. Schenkel, A.V. Hamza, A.V. Barnes, D.S. Walsh, B.L. Doyle, D.H. Schneider,
Analysis of B-SiO₂ films by highly charged ion based time-of-flight secondary ion mass spectrometry, standard secondary ion mass spectrometry and elastic recoil detection,
Journal of Vacuum Science and Technology A 17:303-305, 1998 pdf(108k) ps.gz(172k) bibtex

T. Schenkel, M. Schneider, M. Hattass, M.W. Newman, A.V. Barnes, A.V. Hamza, D.H. Schneider, R.L. Cicero, C.E.D. Chidsey,
Electronic desorption of alkyl monolayers from silicon by very highly charged ions,
Journal of Vacuum Science and Technology A 16:1384-1387, 1998 pdf(136k) bibtex

T. Schenkel, A.V. Barnes, A.V. Hamza, D.H. Schneider,
Cluster ion emission in the interaction of slow highly charged ions with surfaces,
Journal of Vacuum Science and Technology B 16:3298-3301, 1998 pdf(430k) bibtex

T. Schenkel, A.V. Barnes, A.V. Hamza, D.H. Schneider, J.C. Banks, B.L. Doyle,
Synergy of Electronic Excitations and Elastic Collision Spikes in Sputtering of Heavy Metal Oxides,
The European Physical Journal D 1:297-302, 1998 pdf(142k) bibtex

T. Schenkel, A.V. Hamza, A.V. Barnes, D.H. Schneider, J.C. Banks, B.L. Doyle,
Ablation of GaAs by Intense, Ultrafast Electronic Excitation from Highly Charged Ions,
Physcial Review Letters 80:4325-438, 1998 pdf(106k) bibtex

R.E. Marrs, D.H. Schneider, J.W. McDonald,
Projection x-ray microscope powered by highly charged ions,
Physcial Review Letters 81:2590-2593, 1998 pdf(453k) bibtex

G. Weinberg, R.R. Beck, J. Steiger, B.A. Church, J. McDonald, D. Schneider,
Electron capture from H-2 to highly charged Th and Xe ions trapped at center-of-mass energies near 6 eV,
Review of Scientific Instruments 69:204-209, 1998 pdf(328k) bibtex

J. Steiger, B.R. Beck, L. Gruber, D.A. Church, J.P. Holder, D. Schneider,
,
Physical Review A 57:4452-4461, 1998 bibtex

L. Gruber, B.R. Beck, J. Steiger, D. Schneider, J.P. Holder, D.A. Church,
,
in Proceedings of the International Conference on Trapped Charged Particles and Fundamental Physics, 1998 bibtex

T. Schenkel, A.V. Barnes, M.A. Briere, A. Hamza, A. Schachvon Wittenau, D.H. Schneider,
Emission of secondary particles from metals and insulators at impact of slow highly charged ions,
in Proceedings of the 15th International Conference on the Application of Accelerators in Research and Industry, 1997 pdf(444k) bibtex

T. Schenkel, M.A. Briere, H. Schmidt-Böcking, K. Bethge, D.H. Schneider,
Electronic Sputtering of Thin Conductors by Neutralization of slow Highly Charged Ions,
Nuclear Instruments and Methods in Physics Research B 125:153-158, 1997 pdf(130k) bibtex

T. Schenkel, M.A. Briere, A.V. Barnes, A.V. Hamza, K. Bethge, H. Schmidt-Böcking, D.H. Schneider,
Charge State Depenent Energy Loss of Slow Heavy Ions in Solids,
Physical Review Letters 78:2481-2484, 1997 pdf(148k) bibtex

R.E. Marrs,
Recent results from the EBIT and super EBIT at Lawrence Livermore National Laboratory,
Physical Review Letters 79:2030-2033, 1997 bibtex

M.A. Briere, T. Schenkel, D.H. Schneider, P. Bauer, A. Arnau,
Non-equilibrium energy loss for very highly charged ions in insulators,
Physica Scripta T73:354-359, 1997 bibtex

T. Schenkel, M.A. Briere, H. Schmidt-Böcking, K. Bethge, D.H. Schneider,
Electronic sputtering and desorption effects in TOF-SIMS studies using slow highly charged ions like Au69+,
Physica Scripta T73:324-325, 1997 bibtex

T. Schenkel, A.V. Hamza, A.V. Barnes, D.H. Schneider,
Energy loss of slow, highly charged ions in solids,
Materials Science Forum 248-249:413-417, 1997 pdf(125k) bibtex

J.P. Briand, D.H. Schneider, S. Bardin, H. Khemliche, et al.,
X-ray studies of the interaction of N, O, and Ne hydrogenlike ions below surfaces,
Phys. Rev. A 56:R1701-R1704, 1997 pdf(115k) bibtex

M.Reaves, Q.C. Kessel, E. Pollack, W.W. Smith, M.A. Briere, D.H. Schneider,
in Applications of Accelerators in Research and Industry, AIP Conference, p. 165, 1997 bibtex

C. Ruehlicke, D.H. Schneider, R. DuBois, R. Balhorn,
in Applications of Accelerators in Research and Industry, AIP Conference, J.L. Dugan, I.L. Morgan (eds.), p. 519, 1997 bibtex

M.A. Briere, T. Schenkel, D.H. Schneider,
in Proceedings 10th International Conference on Secondary Ion Mass Spectrometry, SIMS X, J.L. Dugan, I.L. Morgan (eds.), p. 212, 1997 bibtex

J. Steiger, G. Weinberg, B. Beck, A. Church, J. McDonald, D. Schneider,
Observation of sequential electron capture to individual highly-charged Th ions,
1997 bibtex

D.H. Schneider,
,
Hyperfine Interaction 108:115-119, 1997 bibtex

D. Schneider,
,
in McGraw Hill Yearbook of Science and Technology, J.L. Dugan, I.L. Morgan (eds.), p. 26, 1996 bibtex

D. Schneider, M.A. Briere,
Investigations of the interactions of highest charge state ions with surfaces,
Hyperfine Interaction 99:47, 1996 bibtex

J.-P. Briand, B. d'Etat-Ban, D. Schneider, M.A. Briere, V.Decaux, J.W. McDonald, S. Bardin,
Time for the empty L shell of a hollow atom to be filled,
Phys. Scr. 53:228-242, 1996 pdf(146k) bibtex

J.-P. Briand, D. Debilly, J. Jin, H. Khemliche, M. Prior, Z. Xie, M. Nectoux, D. Schneider,
Interaction of slow Ar(17,18)+ ions with C-60: An insight into ion-surface interactions,
Physical Review A 53:2194-2199, 1996 pdf(78k) bibtex

J.-P. Briand, G. Giardino, G. Borsoni, M. Froment, D. Schneider, et al.,
Decay of hollow atoms above and below a surface,
Physical Review A 53:R2925-R2928, 1996 pdf(75k) bibtex

G. Schwitiez, M. Briere, D. Schneider, J.W. McDonald, C. Cunningham,
Measurement of negative-ion and cluster sputtering with highly-charged heavy ions,
Physical Review A 54:4136-4139, 1995 pdf(652k) bibtex

C. Ruehlicke, M.A. Briere, D. Schneider,
AFM Studies of a New-Type of Radiation Defect on MICA Surfaces Caused by Highly-Charged Ion Impact,
Nuclear Instruments and Methods in Physics Research B 100:47-54, 1995 pdf(328k) bibtex

T. Schenkel, M.A. Briere, A.E. Schach von Wittenau, D. Schneider,
,
Nuclear Instruments and Methods in Physics Research B 99:528-531, 1995 bibtex

M. LeGros, E. Silver, D. Schneider, J.W. McDonald, S. Bardin, R. Schuch, N, Madden, J. Beeman,
the first high resolution, broad band x-ray spectroscopy of ion-surface interactions using a microcalorimeter,
in Proceedings of the 43rd ASMS Conference on Mass Spectrometry and Allied Topics, J.L. Dugan, I.L. Morgan (eds.), p. 1336, 1995 pdf(325k) bibtex

R.E. Marrs, S.R. Elliot, D.A. Knapp,
Production and Trapping of Hydrogenlike and Bare Uranium Ions in an Electron-Beam Ion-Trap,
Nuclear Instruments and Methods in Physics Research A 357:110-114, 1994 pdf(811k) bibtex

R. Marrs, P. Beiersdorfer, D. Schneider,
The Electron-Beam Ion-Trap,
Physical Review Letters 72:4082-4085, 1994 bibtex

M.A. Briere, D. Schneider, J. McDonald, M. Reaves, C. Ruehlicke, G. Weinberg, D. Knapp,
Studies of the Interaction of slow very Highly Charged Ions with surfaces Solid using the LLNL EBIT Facility,
Physics Today 47:27-34, 1994 bibtex

H. Kurz, F. Aumayr, H.P. Winter, D. Schneider, M.A. Briere, J.W. McDonald,
Electron Emission and Image-Charge Acceleration for the Impact of Very Highly Charged Ions on Clean Gold,
Nuclear Instruments and Methods in Physics Research B 90:231-236, 1994 pdf(1805k) bibtex

D. Schneider, M.A. Briere, J.W. McDonald, W. Siekhaus,
Observation of Defects on Insulator Surfaces Following Bombardment with Slow KR-35+, XE-44+, TH-74+ and U-70+ Ions,
Physical Review A 49:4693-4702, 1994 bibtex

J.P. Briand, B. d'Etat, D. Schneider, M. Clark, V. Decaux,
On the Mechanism of Formation of Hollow Atoms Below a Surface,
Nuclear Instruments and Methods in Physics Research B 87:156-161, 1994 bibtex

F. Aumayr, H. Kurz, H.P. Winter, D. Schneider, M.A. Briere, J.W. McDonald,
Distinction between multicharged Ion Species with equal q/m,
Nucl. Instr. and Meth. B87, 1993 bibtex

F. Aumayr, H. Kurz, D. Schneider, M.A. Briere, J.W. McDonald, C.E. Cunningham, H.P. Winter,
Emission of Electrons from a Clean Gold Surface Induced by Slow, Very Highly Charged Ions at the Image Charge Acceleration Limit,
Review of Scientific Instruments 64:3499-3502, 1993 pdf(611k) bibtex

D.H. Schneider, M.A. Briere, J.W. McDonald, J. Biersack,
Ion Surface Interaction Studies with 1-3 keV/amu Ions up to Th80+,
Physical Review Letters 71:1943-1946, 1993 bibtex

D. Schneider, M.A. Briere, M.W. Clark, J. McDonald, J. Biersack, W. Siekhaus,
Atomic Displacement due to the Electrostatic Potential Energy of very Highly Charged Ions at Solid Surfaces,
Radiation Effects and Defects in Solids 127:113-136, 1993 bibtex

R. Schuch, D. Schneider, D.A. Knapp, D. DeWitt, J.W. McDonald, M.H. Chen, M.W. Clark, R.E. Marrs,
Evidence for Internal Dielectronic Excitation of slow Highly Charged Uranium Ions,
Surface Science 294:403-408, 1993 pdf(669k) bibtex

M.W. Clark, D. Schneider, D. DeWitt, J.W. McDonald, R. Bruch, U.I. Safronova, I. Yu. Tolstikhina, R. Schuch,
Xe-L and M X-Ray Emission Following Xe^44-48+ Ion Impact on Cu Surfaces,
Physical Review Letters 70:1073-1076, 1993 pdf(2071k) bibtex

M.W. Clark, D.H. Schneider, E.F. Deveney, Q.C. Kessel, E. Pollack, W.W. Smith,
X-Ray-Emission from BI50+ to BI71+ Ions Incident on a Gold Surface,
Physical Review A 47:3983-3997, 1993 bibtex

G. Schiwietz, D. Schneider, M. Clark, B. Skogvall, D. DeWitt, J.W. McDonald,
Particle Emission Induced by the Interaction of Highly Charged Slow Xe-Ions with a XiO₂ Surface,
Nucl. Instr. and Meth. B79:183-185, 1993 bibtex

D. DeWitt, D. Schneider, M.H. Chen, M.B. Schneider, D. Church, G. Weinberg, M. Sakurai,
Dielectronic Recombination Cross Sections of Fluorinelike Xenon,
Radiation Effects and Defects in Solids 127:11-14, 1993 pdf(704k) bibtex

D.A. Knapp, R.E. Marrs, S.R. Elliot, E.W. Magee, R. Zasadzinski,
A High-Energy Electron-Beam Ion-Trap for Production of High-Charge High-Z Ions,
Physical Review A 47:R1597-R1600, 1993 bibtex

U.I. Safronova, I. YuTolstikhina, R. Bruch, T. Tanaka, F. Hao, D. Schneider,
Screening Theory for Transition Energies of Highly Charged Ions,
Nucl. Instrum. Methods A334:305-312, 1993 bibtex

J.W. McDonald, D. Schneider, M.W. Clark, D. DeWitt,
Observation of High Electron Emission Yields Following Highly Charged Ion Impact (up to Th⁷⁵⁺) on Surfaces,
Physica Scripta 47:364-382, 1992 pdf(605k) bibtex

D. DeWitt, D. Schneider, M.H. Chen, M.W. Clark, J.W. McDonald, M.B. Schneider,
Dielectronic Recombination Cross Sections of Neonlike Xenon,
Physical Review Letters 68:2297-2300, 1992 pdf(548k) bibtex

D. Schneider, M.W. Clark, B.M. Penetrate, J.W. McDonald, D. DeWitt, J.N. Bardslay,
Production of High-Charge-State Thorium and Uranium Ions in an Electron-Beam Ion Trap,
Physical Review Letters 68, 1991 pdf(1011k) bibtex

D. DeWitt, D. Schneider, M.W. Clark, M.H. Chen, D. Church,
Dielectronic-Recombination Cross-Sections of Hydrogenlike Argon,
Physical Review A 44:3119-3124, 1991 pdf(647k) bibtex

J.N. Bardsley, B. M. Penetrante,
,
Phyical Review A 44:7185-7188, 1991 bibtex

D. Schneider, D. DeWitt, M.W. Clark, R. Schuch, C.L. Cocke, R. Schmieder, R.J. Reed, M.H. Chen, R.E. Marrs, M. Levine, R. Fortner,
Ion-Collision Experiments With Slow, Very Highly Charged Ions Extracted From an Electron-Beam Ion Trap,
Comments At. Mol. Phys. 27:43, 1990 pdf(1187k) bibtex

R.E. Marrs, M.A. Levine, D.A. Knapp, J.R. Henderson,
Measurement of Electron-Impact-Excitation Cross Sections For Very Highly Charged Ions,
Physical Review A 42:3889-3895, 1988 pdf(631k) bibtex

M.A. Levine, R.E. Marrs, J.R. Henderson, D.A. Knapp, M.B. Schneider,
The Electron-Beam Ion Trap - A New Instrument For Atomic Physics Measurements,
Physical Review Letters 60:1715-1718, 1988 bibtex

R.E. Marrs, P.O. Egan, I. Proctor, M.A. Levine, L. Hansen, Y. Kajiyama, R. Wolgast,
,
Physica Scripta T22:157-163, 1985 bibtex

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EBIT - The Electron Beam Ion Trap

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